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[资料] 2007 DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS 2nd Edition	squall418 2011-6-27	74025	leon_strive 2024-12-26 17:43
[求助] 请问parallel仿真的时候波形为什么有shift操作？不应该只有force和capture操作吗？	黑崎一护776 2018-8-1	72801	leon_strive 2024-12-26 17:42
Continuity Test，BasicsOfLowCurrentProbing，静态电流 ...2	zhongshanli 2008-10-13	185519	leon_strive 2024-12-26 17:41
[资料] stanford-Chip Test and Debug Seminar ...2	kanbin 2010-9-17	155276	leon_strive 2024-12-26 17:37
[资料] [IC测试标准]温度循环测试 ...2	free2bird 2010-8-1	135569	leon_strive 2024-12-26 17:36
[原创] Electronic Test Instruments Analog and Digital Measurements 2nd [Witte R.A] ...2	tmd007 2023-5-25	112584	opqfeixue122 2024-12-26 17:09
[资料] hight frequency at speed test	陆地巡洋舰 2019-3-22	32119	慕之少艾 2024-12-26 16:59
motolola内部的design for test_TestBasics_Class ...2 3 4 5 6	zhongshanli 2008-10-13	5714995	慕之少艾 2024-12-26 16:58
Morgan ClayPool : an introduction to logic circuit testing ...2	xudeqiang 2009-2-26	124602	igolaps 2024-12-26 15:03
Scan原理介绍(Soft Test),english version ...2 3 4 5 6..8	liuyunwujia 2009-5-4	7721826	leon_strive 2024-12-26 14:52
Softtest Funtional Test ...2	henrygao 2008-9-11	175589	leon_strive 2024-12-26 14:30
[资料] Test Pattern Validation User Guide ...2 3 4	staric 2010-12-3	3213556	leon_strive 2024-12-26 14:21
[资料] EDA for IC System Design Verification and Testing（英文版） ...2 3 4	lgy607 2010-12-1	308210	leon_strive 2024-12-26 11:20
Essentials of Electronic Testing for Digital Memory ...2 3 4 5 6..8	fong1212 2007-11-9	7820207	leon_strive 2024-12-26 10:46
[资料] RF Microelectronics [Behzad Razavi]	zhimigan 2022-1-5	72018	leon_strive 2024-12-26 10:45
ic测试书籍7件套之1 ...2 3 4	zhongshanli 2008-10-13	3811843	leon_strive 2024-12-26 10:08
A test article ...2	ihlin0733 2009-6-27	115065	leon_strive 2024-12-25 17:23
[资料] 不错的资料，集成电路面试必备之关于关于Memory Modeling ...2 3	nano_dv 2018-1-19	227115	xj0ipk 2024-12-25 16:49
[资料] Design, Automation, and Test in Europe-10 years	陆地巡洋舰 2019-3-22	92474	leon_strive 2024-12-25 14:02
Essentials of electronic testing-digital memory，mixed-signal VLSI) ...2 3 4 5 6..8	qq098 2008-4-13	7221007	leon_strive 2024-12-25 13:59
[资料] ISO-26262	xylcool5 2022-3-26	42126	leon_strive 2024-12-25 13:57
[资料] 集成电路面试必备之关于测试覆盖率 ...2 3 4 5	nano_dv 2018-1-5	4711047	250740247 2024-12-25 10:40
[资料] 93K应用手册 - [阅读权限 255] ...2	bm57145974 2024-8-16	131618	250740247 2024-12-25 10:38
[资料] 三个DFT资料 ...2 3 4 5 6..7	nbuzs 2009-12-17	6116858	250740247 2024-12-25 10:33
[资料] Books--Arithmetic Built-in Self-Test for Embedded Systems ...2	一岁就很帅 2019-3-28	134567	leon_strive 2024-12-25 09:55
[资料] VLSI测试与可测试性设计的课件 ...2 3	Diannee 2021-7-15	256131	leon_strive 2024-12-25 09:52
[资料] Scan Chain Design ...2 3 4 5	gangersun 2011-8-19	4113858	leon_strive 2024-12-25 09:50
基于ATE的IC测试原理方法及故障分析 ...2 3 4 5 6	zweishi 2008-8-21	5214158	leon_strive 2024-12-25 09:49
IC测试原理解析 ...2 3 4 5	tigerxixi 2009-11-12	4611470	leon_strive 2024-12-25 09:46
[资料] 高速数字信号的眼图和抖动/噪声测量技术-keysight ...2 3 4 5 6	不懂也不问 2019-1-24	5510217	leon_strive 2024-12-25 09:45
[资料] VLSI Circuit Design Methodology Demystified - A Conceptual Taxonomy ...2	zhimigan 2022-1-7	143827	leon_strive 2024-12-25 09:45
Production Testing of RF and Soc ...2 3 4 5	the_4400 2009-7-2	4010685	leon_strive 2024-12-25 09:43
[资料] mbist理论知识 ...2 3 4 5 6..17	ys82 2011-2-23	16038468	leon_strive 2024-12-24 22:20
[资料] CIC 2011 V93K 数字IC测试lab ...2 3 4	lingqinzi 2012-4-29	3511520	leon_strive 2024-12-24 22:08
[资料] DFT & ATPG ...2 3 4 5 6..21	gangersun 2011-8-24	20451468	leon_strive 2024-12-23 16:55

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