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[资料] Scan Chain Design ...2 3 4 5	gangersun 2011-8-19	4113379	leon_strive 2024-12-25 09:50
基于ATE的IC测试原理方法及故障分析 ...2 3 4 5 6	zweishi 2008-8-21	5213633	leon_strive 2024-12-25 09:49
IC测试原理解析 ...2 3 4 5	tigerxixi 2009-11-12	4610911	leon_strive 2024-12-25 09:46
[资料] 高速数字信号的眼图和抖动/噪声测量技术-keysight ...2 3 4 5 6	不懂也不问 2019-1-24	559636	leon_strive 2024-12-25 09:45
[资料] VLSI Circuit Design Methodology Demystified - A Conceptual Taxonomy ...2	zhimigan 2022-1-7	143531	leon_strive 2024-12-25 09:45
Production Testing of RF and Soc ...2 3 4 5	the_4400 2009-7-2	4010302	leon_strive 2024-12-25 09:43
[资料] mbist理论知识 ...2 3 4 5 6..17	ys82 2011-2-23	16037051	leon_strive 2024-12-24 22:20
[资料] CIC 2011 V93K 数字IC测试lab ...2 3 4	lingqinzi 2012-4-29	3511094	leon_strive 2024-12-24 22:08
[资料] DFT & ATPG ...2 3 4 5 6..21	gangersun 2011-8-24	20449832	leon_strive 2024-12-23 16:55
[资料] Fundamental Of Testing On ATE ...2 3 4	zhimigan 2022-1-7	305394	leon_strive 2024-12-23 16:30
DFT全部官方资料 ...2 3 4 5 6..16	cdchen 2009-10-27	15229324	leon_strive 2024-12-23 10:42
[资料] 分享一本松本行弘的书编程语言的设计与实现松本行弘 ...2	dreamfly123123 2023-5-18	122200	leon_strive 2024-12-23 10:41
[资料] Test Generation of Crosstalk Delay Faults in VLSI Circuits @2018 ...2	2046 2022-10-31	132233	jimcmwang 2024-12-22 22:54
[资料] Contactless VLSI Measurement and Testing Techniques @2018 ...2	2046 2022-10-24	122360	jimcmwang 2024-12-22 22:48
[资料] High-Performance_Low-Power_Cache_Memory_Architectures ...2	zhimigan 2022-1-7	143184	jimcmwang 2024-12-22 22:45
[资料] Multi-run Memory Tests for Pattern Sensitive Faults ...2	dongcy 2022-3-22	143291	jimcmwang 2024-12-22 22:44
[资料] Advanced Test Methods for SRAMs ...2 3 4 5 6..9	squall418 2011-6-22	8221713	leon_strive 2024-12-22 21:34
SOC test architectures ...2	zuzumi 2009-8-13	154981	leon_strive 2024-12-22 17:27
[资料] 通信协议IIC和SPI_Reference	Trlest 2023-12-1	2897	leon_strive 2024-12-22 17:27
Flash Memory测试技术发展 ...2 3 4 5 6..8	fancykid 2008-12-26	7820572	leon_strive 2024-12-22 16:31
龙芯课题组测试培训讲义 ...2 3 4 5 6..7	tsinghuau 2008-6-26	6817600	leon_strive 2024-12-22 16:28
[资料] Loigc Vision关于Memory Repair介绍一篇文章 ...2	lyt8650 2023-6-12	132191	leon_strive 2024-12-22 16:16
[资料] characterization of cmos image sensor	zhimigan 2022-1-5	72353	leon_strive 2024-12-22 16:14
[资料] WAT测试结构与测试方法 ...2 3 4 5 6..7	爱吃油条 2018-12-19	6211071	leon_strive 2024-12-22 16:14
[其它] 半导体的测试和返修方案 ...2	cherry.liu 2015-9-30	134917	leon_strive 2024-12-22 16:11
[资料] J750 Time Measurement Template document	鲨鱼辣椒123 2019-3-19	62361	leon_strive 2024-12-22 16:10
tek TDR测试技术! ...2 3 4 5	liaochubiao 2007-11-25	4311517	leon_strive 2024-12-22 16:09
J750 MSO培训资料 ...2	apats 2009-1-19	165663	leon_strive 2024-12-22 16:08
[资料] ATE test introduction ...2 3 4 5 6..8	sunyzs 2012-5-19	7519196	leon_strive 2024-12-22 10:59
[资料] 康奈尔大学Design for Test课程资料，复参考课本 ...2 3 4 5 6..8	itachi90 2014-7-18	7122467	leon_strive 2024-12-22 10:46
[资料] The Boundary-Scan Handbook, 4th edition @2016 ...2 3 4 5	2046 2022-10-26	425219	leon_strive 2024-12-22 10:44
DFT设计基础 ...2 3 4 5 6..22	双氧水 2009-9-28	21235445	leon_strive 2024-12-22 10:40
[资料] DFT相关资料，很详细！ ...2 3 4 5 6..14	IANLAM2 2013-10-11	13539286	leon_strive 2024-12-22 10:38
台灣CIC DFT 教程 ...2 3 4 5 6..30	icwu 2007-10-12	29059583	leon_strive 2024-12-22 10:26
[资料] dft 资料，台湾一个老师写的ppt，感觉不错 ...2 3 4 5 6..19	syf1088 2011-11-5	18537818	leon_strive 2024-12-22 10:25

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