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资料区今日: 0|主题: 823|排名: 25

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[资料] Freescale的DFT培训资料 ...2 3	gckdren 2010-5-2	298882	elantec 2025-1-9 10:56
[求助] Tetramax ATPG时生成的测试向量很少	heartzhizi 2016-10-10	66448	yiw_1 2025-1-8 00:37
[转贴] memory test pattern ...2 3 4 5 6	peterlin2010 2018-1-27	5315159	igolaps 2025-1-4 17:42
IC测试原理解析 ...2	Ghost_xia 2009-3-20	113976	dmf336 2025-1-2 16:46
[资料] VLSI测试与可测性ppt ...2	lull0815 2010-1-25	166946	sumit_enggr 2024-12-29 16:41
[资料] 可用于测试开发高频芯片用的座子	lingmei 2012-5-8	52854	leon_strive 2024-12-27 18:33
减少数字集成电路测试时间的扫描链配置.pdf ...2 3	xianxiao 2008-7-5	298274	leon_strive 2024-12-27 18:32
[原创] 边界扫描Flash测试	cigarlover 2013-11-17	42786	leon_strive 2024-12-27 18:31
IC测试原理解析3	Ghost_xia 2009-3-20	94029	leon_strive 2024-12-27 18:26
[资料] IEEE 1149.5-1995	zhong1990 2024-12-27	1574	flyskyseu 2024-12-27 17:37
[求助] 模拟芯片在仿真阶段可以做aging的仿真么？	wstorfy 2017-9-22	12551	leon_strive 2024-12-27 17:17
[原创] Soft-Test Fundamentals of Mixed Signal Testing	alexchiang 2010-7-1	84106	leon_strive 2024-12-27 17:15
[资料] synopsys DFTC ,Tetramax, Mentor BSDarchitect MBISTarchitect	flow2000a 2017-11-8	22701	flyskyseu 2024-12-27 16:51
JTAG测试技术_PCB ...2 3 4 5 6	lemomn 2008-2-3	5714826	leon_strive 2024-12-27 16:49
Device Interface Board for Wireless LAN Testing ...2 3	lemomn 2008-2-3	267801	leon_strive 2024-12-27 16:48
[资料] DAC静态参数测试	gangersun 2011-8-19	43063	leon_strive 2024-12-27 16:46
Digital_test	smartbear_06 2009-6-9	42667	leon_strive 2024-12-27 16:42
[资料] J750 RFID option boad test RFID TAG CASE	Josh_wei 2013-7-2	84779	leon_strive 2024-12-27 16:39
[资料] 刚安装好synopsys ,来分享一波文件，design compiler已经成功安装	deeeeepblue 2017-8-24	82677	leon_strive 2024-12-27 16:38
[资料] IC半导体测试基础--中文版 ...2 3 4 5 6..9	sminyi 2020-3-7	8118069	品博锦取_2021 2024-12-27 10:46
[资料] 半导体测试基础 ...2	鲨鱼辣椒123 2019-3-19	103485	品博锦取_2021 2024-12-27 10:42
[资料] 超大规模集成电路测试---pdg版 ...2 3	wlbce 2012-3-15	267140	leon_strive 2024-12-27 10:34
[资料] Mixed Circuit Test Theory ...2	gangersun 2011-8-19	174885	leon_strive 2024-12-26 17:45
[新书首发]Production Testing of RF and SoC Devices for Wireless Communications ...2 3 4 5 6..8	AroundSky 2009-9-27	7717082	leon_strive 2024-12-26 17:44
[资料] 2007 DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS 2nd Edition	squall418 2011-6-27	74127	leon_strive 2024-12-26 17:43
[求助] 请问parallel仿真的时候波形为什么有shift操作？不应该只有force和capture操作吗？	黑崎一护776 2018-8-1	72908	leon_strive 2024-12-26 17:42
Continuity Test，BasicsOfLowCurrentProbing，静态电流 ...2	zhongshanli 2008-10-13	185689	leon_strive 2024-12-26 17:41
[资料] stanford-Chip Test and Debug Seminar ...2	kanbin 2010-9-17	155449	leon_strive 2024-12-26 17:37
[资料] [IC测试标准]温度循环测试 ...2	free2bird 2010-8-1	135795	leon_strive 2024-12-26 17:36
[原创] Electronic Test Instruments Analog and Digital Measurements 2nd [Witte R.A] ...2	tmd007 2023-5-25	112732	opqfeixue122 2024-12-26 17:09
[资料] hight frequency at speed test	陆地巡洋舰 2019-3-22	32219	慕之少艾 2024-12-26 16:59
motolola内部的design for test_TestBasics_Class ...2 3 4 5 6	zhongshanli 2008-10-13	5715361	慕之少艾 2024-12-26 16:58
Morgan ClayPool : an introduction to logic circuit testing ...2	xudeqiang 2009-2-26	124739	igolaps 2024-12-26 15:03
Scan原理介绍(Soft Test),english version ...2 3 4 5 6..8	liuyunwujia 2009-5-4	7722422	leon_strive 2024-12-26 14:52
Softtest Funtional Test ...2	henrygao 2008-9-11	175776	leon_strive 2024-12-26 14:30

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