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资料区 今日: 0|主题: 786|排名: 20 

[资料] IEEE 1149.4-2024 attachment zhong1990 2024-12-27 3275 warewise6836 2024-12-27 22:46
[资料] 六西格玛管理统计指南 MINTAB使用指导 第3版 attach_img flamingo123 2024-12-27 4309 student321 2024-12-27 21:10
[资料] 可测性设计最新讲案 attachment  ...2 dl_ic 2012-9-1 174536 leon_strive 2024-12-27 18:34
[资料] 可用于测试开发高频芯片用的座子 attachment lingmei 2012-5-8 52442 leon_strive 2024-12-27 18:33
减少数字集成电路测试时间的扫描链配置.pdf attachment  ...23 xianxiao 2008-7-5 297143 leon_strive 2024-12-27 18:32
[原创] 边界扫描Flash测试 cigarlover 2013-11-17 42459 leon_strive 2024-12-27 18:31
[原创] 多年收集的SCAN和MBIST测试资料 attachment  ...2345 formyideal 2011-11-23 4812275 leon_strive 2024-12-27 18:29
IC测试原理解析3 attachment Ghost_xia 2009-3-20 93658 leon_strive 2024-12-27 18:26
[资料] IEEE 1149.6-2015 attachment zhong1990 2024-12-27 1193 flyskyseu 2024-12-27 17:50
[资料] IEEE 1149.5-1995 attachment zhong1990 2024-12-27 1164 flyskyseu 2024-12-27 17:37
[求助] 模拟芯片在仿真阶段可以做aging的仿真么? wstorfy 2017-9-22 12280 leon_strive 2024-12-27 17:17
[原创] Soft-Test Fundamentals of Mixed Signal Testing attachment alexchiang 2010-7-1 83723 leon_strive 2024-12-27 17:15
[资料] synopsys DFTC ,Tetramax, Mentor BSDarchitect MBISTarchitect flow2000a 2017-11-8 22339 flyskyseu 2024-12-27 16:51
JTAG测试技术_PCB attachment  ...23456 lemomn 2008-2-3 5712472 leon_strive 2024-12-27 16:49
Device Interface Board for Wireless LAN Testing attachment  ...23 lemomn 2008-2-3 266841 leon_strive 2024-12-27 16:48
[资料] DAC静态参数测试 attachment gangersun 2011-8-19 42673 leon_strive 2024-12-27 16:46
Digital_test attachment smartbear_06 2009-6-9 42329 leon_strive 2024-12-27 16:42
[资料] J750 RFID option boad test RFID TAG CASE attachment Josh_wei 2013-7-2 84231 leon_strive 2024-12-27 16:39
[资料] 刚安装好synopsys ,来分享一波文件,design compiler已经成功安装 attachment deeeeepblue 2017-8-24 82256 leon_strive 2024-12-27 16:38
[资料] 模拟电路版图的艺术中文第二版 attachment  ...23 youbuweige 2020-2-24 255985 leon_strive 2024-12-27 11:25
[资料] IC半导体测试基础--中文版 attachment  ...23456..9 sminyi 2020-3-7 8115241 品博锦取_2021 2024-12-27 10:46
[资料] 集成电路测试指南-2021年 attach_img  ...2345 邝卓宇 2023-12-29 463771 ic886 2024-12-27 10:45
[资料] 电子产品老化标准 新人帖 attachment  ...23 cceenn 2020-4-15 265961 品博锦取_2021 2024-12-27 10:45
[资料] 模拟集成电路与系统 attach_img zhimigan 2022-1-6 31878 品博锦取_2021 2024-12-27 10:43
[资料] 半导体测试基础 attachment  ...2 鲨鱼辣椒123 2019-3-19 102955 品博锦取_2021 2024-12-27 10:42
[资料] 超大规模集成电路测试---pdg版 attachment  ...23 wlbce 2012-3-15 266032 leon_strive 2024-12-27 10:34
[资料] 元器件可靠性及电路可靠性设计 lockera 2017-12-4 31982 313949724 2024-12-26 23:05
[资料] IEEE 1500-2022 attachment zhong1990 2024-12-26 3424 student321 2024-12-26 19:28
[资料] Engineering - Essentials of Electronic Testing attachment  ...2 enyafans 2010-11-15 125783 leon_strive 2024-12-26 17:46
[资料] Mixed Circuit Test Theory attachment  ...2 gangersun 2011-8-19 174115 leon_strive 2024-12-26 17:45
[新书首发]Production Testing of RF and SoC Devices for Wireless Communications attachment  ...23456..8 AroundSky 2009-9-27 7714348 leon_strive 2024-12-26 17:44
[资料] 2007 DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS 2nd Edition attachment squall418 2011-6-27 73713 leon_strive 2024-12-26 17:43
[求助] 请问parallel仿真的时候波形为什么有shift操作?不应该只有force和capture操作吗? 黑崎一护776 2018-8-1 72492 leon_strive 2024-12-26 17:42
Continuity Test,BasicsOfLowCurrentProbing,静态电流 attachment  ...2 zhongshanli 2008-10-13 184983 leon_strive 2024-12-26 17:41
[资料] 半导体测试项目简介 attachment gangersun 2011-8-19 53864 leon_strive 2024-12-26 17:40
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