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[资料] Mixed Circuit Test Theory ...2	gangersun 2011-8-19	175111	leon_strive 2024-12-26 17:45
[资料] 2007 DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS 2nd Edition	squall418 2011-6-27	74310	leon_strive 2024-12-26 17:43
[求助] 请问parallel仿真的时候波形为什么有shift操作？不应该只有force和capture操作吗？	黑崎一护776 2018-8-1	73078	leon_strive 2024-12-26 17:42
Continuity Test，BasicsOfLowCurrentProbing，静态电流 ...2	zhongshanli 2008-10-13	185896	leon_strive 2024-12-26 17:41
[资料] stanford-Chip Test and Debug Seminar ...2	kanbin 2010-9-17	155662	leon_strive 2024-12-26 17:37
[资料] [IC测试标准]温度循环测试 ...2	free2bird 2010-8-1	136021	leon_strive 2024-12-26 17:36
[资料] hight frequency at speed test	陆地巡洋舰 2019-3-22	32348	慕之少艾 2024-12-26 16:59
motolola内部的design for test_TestBasics_Class ...2 3 4 5 6	zhongshanli 2008-10-13	5716036	慕之少艾 2024-12-26 16:58
Morgan ClayPool : an introduction to logic circuit testing ...2	xudeqiang 2009-2-26	124953	igolaps 2024-12-26 15:03
Scan原理介绍(Soft Test),english version ...2 3 4 5 6..8	liuyunwujia 2009-5-4	7723577	leon_strive 2024-12-26 14:52
Softtest Funtional Test ...2	henrygao 2008-9-11	176029	leon_strive 2024-12-26 14:30
[资料] Test Pattern Validation User Guide ...2 3 4	staric 2010-12-3	3214216	leon_strive 2024-12-26 14:21
Essentials of Electronic Testing for Digital Memory ...2 3 4 5 6..8	fong1212 2007-11-9	7821486	leon_strive 2024-12-26 10:46
[资料] RF Microelectronics [Behzad Razavi]	zhimigan 2022-1-5	72360	leon_strive 2024-12-26 10:45
A test article ...2	ihlin0733 2009-6-27	115410	leon_strive 2024-12-25 17:23
[资料] 不错的资料，集成电路面试必备之关于关于Memory Modeling ...2 3	nano_dv 2018-1-19	227971	xj0ipk 2024-12-25 16:49
[资料] Design, Automation, and Test in Europe-10 years	陆地巡洋舰 2019-3-22	92664	leon_strive 2024-12-25 14:02
Essentials of electronic testing-digital memory，mixed-signal VLSI) ...2 3 4 5 6..8	qq098 2008-4-13	7222038	leon_strive 2024-12-25 13:59
[资料] ISO-26262	xylcool5 2022-3-26	42332	leon_strive 2024-12-25 13:57
[资料] 93K应用手册 - [阅读权限 255] ...2	bm57145974 2024-8-16	131618	250740247 2024-12-25 10:38
[资料] Books--Arithmetic Built-in Self-Test for Embedded Systems ...2	一岁就很帅 2019-3-28	134881	leon_strive 2024-12-25 09:55
[资料] VLSI测试与可测试性设计的课件 ...2 3	Diannee 2021-7-15	256826	leon_strive 2024-12-25 09:52
[资料] Scan Chain Design ...2 3 4 5	gangersun 2011-8-19	4114876	leon_strive 2024-12-25 09:50
基于ATE的IC测试原理方法及故障分析 ...2 3 4 5 6	zweishi 2008-8-21	5215227	leon_strive 2024-12-25 09:49
IC测试原理解析 ...2 3 4 5	tigerxixi 2009-11-12	4612332	leon_strive 2024-12-25 09:46
[资料] 高速数字信号的眼图和抖动/噪声测量技术-keysight ...2 3 4 5 6	不懂也不问 2019-1-24	5511325	leon_strive 2024-12-25 09:45
[资料] VLSI Circuit Design Methodology Demystified - A Conceptual Taxonomy ...2	zhimigan 2022-1-7	144379	leon_strive 2024-12-25 09:45
Production Testing of RF and Soc ...2 3 4 5	the_4400 2009-7-2	4011360	leon_strive 2024-12-25 09:43
[资料] CIC 2011 V93K 数字IC测试lab ...2 3 4	lingqinzi 2012-4-29	3512288	leon_strive 2024-12-24 22:08
[资料] 分享一本松本行弘的书编程语言的设计与实现松本行弘 ...2	dreamfly123123 2023-5-18	122826	leon_strive 2024-12-23 10:41
[资料] Test Generation of Crosstalk Delay Faults in VLSI Circuits @2018 ...2	2046 2022-10-31	132840	jimcmwang 2024-12-22 22:54
[资料] Contactless VLSI Measurement and Testing Techniques @2018 ...2	2046 2022-10-24	123002	jimcmwang 2024-12-22 22:48
[资料] High-Performance_Low-Power_Cache_Memory_Architectures ...2	zhimigan 2022-1-7	143754	jimcmwang 2024-12-22 22:45
[资料] Multi-run Memory Tests for Pattern Sensitive Faults ...2	dongcy 2022-3-22	143938	jimcmwang 2024-12-22 22:44
[资料] Advanced Test Methods for SRAMs ...2 3 4 5 6..9	squall418 2011-6-22	8224734	leon_strive 2024-12-22 21:34

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