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[资料] IEEE 1149.5-1995	zhong1990 2024-12-27	1797	flyskyseu 2024-12-27 17:37
[求助] 模拟芯片在仿真阶段可以做aging的仿真么？	wstorfy 2017-9-22	12707	leon_strive 2024-12-27 17:17
[原创] Soft-Test Fundamentals of Mixed Signal Testing	alexchiang 2010-7-1	84304	leon_strive 2024-12-27 17:15
[资料] synopsys DFTC ,Tetramax, Mentor BSDarchitect MBISTarchitect	flow2000a 2017-11-8	22914	flyskyseu 2024-12-27 16:51
JTAG测试技术_PCB ...2 3 4 5 6	lemomn 2008-2-3	5715874	leon_strive 2024-12-27 16:49
Device Interface Board for Wireless LAN Testing ...2 3	lemomn 2008-2-3	268348	leon_strive 2024-12-27 16:48
[资料] DAC静态参数测试	gangersun 2011-8-19	43218	leon_strive 2024-12-27 16:46
Digital_test	smartbear_06 2009-6-9	42781	leon_strive 2024-12-27 16:42
[资料] J750 RFID option boad test RFID TAG CASE	Josh_wei 2013-7-2	85036	leon_strive 2024-12-27 16:39
[资料] 刚安装好synopsys ,来分享一波文件，design compiler已经成功安装	deeeeepblue 2017-8-24	82914	leon_strive 2024-12-27 16:38
[资料] 半导体测试基础 ...2	鲨鱼辣椒123 2019-3-19	103734	品博锦取_2021 2024-12-27 10:42
[资料] 超大规模集成电路测试---pdg版 ...2 3	wlbce 2012-3-15	267625	leon_strive 2024-12-27 10:34
[资料] Mixed Circuit Test Theory ...2	gangersun 2011-8-19	175209	leon_strive 2024-12-26 17:45
[资料] 2007 DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS 2nd Edition	squall418 2011-6-27	74374	leon_strive 2024-12-26 17:43
[求助] 请问parallel仿真的时候波形为什么有shift操作？不应该只有force和capture操作吗？	黑崎一护776 2018-8-1	73139	leon_strive 2024-12-26 17:42
Continuity Test，BasicsOfLowCurrentProbing，静态电流 ...2	zhongshanli 2008-10-13	185980	leon_strive 2024-12-26 17:41
[资料] stanford-Chip Test and Debug Seminar ...2	kanbin 2010-9-17	155782	leon_strive 2024-12-26 17:37
[资料] [IC测试标准]温度循环测试 ...2	free2bird 2010-8-1	136131	leon_strive 2024-12-26 17:36
[资料] hight frequency at speed test	陆地巡洋舰 2019-3-22	32399	慕之少艾 2024-12-26 16:59
motolola内部的design for test_TestBasics_Class ...2 3 4 5 6	zhongshanli 2008-10-13	5716268	慕之少艾 2024-12-26 16:58
Morgan ClayPool : an introduction to logic circuit testing ...2	xudeqiang 2009-2-26	125028	igolaps 2024-12-26 15:03
Scan原理介绍(Soft Test),english version ...2 3 4 5 6..8	liuyunwujia 2009-5-4	7723924	leon_strive 2024-12-26 14:52
Softtest Funtional Test ...2	henrygao 2008-9-11	176140	leon_strive 2024-12-26 14:30
[资料] Test Pattern Validation User Guide ...2 3 4	staric 2010-12-3	3214381	leon_strive 2024-12-26 14:21
Essentials of Electronic Testing for Digital Memory ...2 3 4 5 6..8	fong1212 2007-11-9	7821802	leon_strive 2024-12-26 10:46
[资料] RF Microelectronics [Behzad Razavi]	zhimigan 2022-1-5	72418	leon_strive 2024-12-26 10:45
A test article ...2	ihlin0733 2009-6-27	115447	leon_strive 2024-12-25 17:23
[资料] 不错的资料，集成电路面试必备之关于关于Memory Modeling ...2 3	nano_dv 2018-1-19	228148	xj0ipk 2024-12-25 16:49
[资料] Design, Automation, and Test in Europe-10 years	陆地巡洋舰 2019-3-22	92709	leon_strive 2024-12-25 14:02
Essentials of electronic testing-digital memory，mixed-signal VLSI) ...2 3 4 5 6..8	qq098 2008-4-13	7222215	leon_strive 2024-12-25 13:59
[资料] ISO-26262	xylcool5 2022-3-26	42376	leon_strive 2024-12-25 13:57
[资料] 93K应用手册 - [阅读权限 255] ...2	bm57145974 2024-8-16	131618	250740247 2024-12-25 10:38
[资料] Books--Arithmetic Built-in Self-Test for Embedded Systems ...2	一岁就很帅 2019-3-28	134937	leon_strive 2024-12-25 09:55
[资料] VLSI测试与可测试性设计的课件 ...2 3	Diannee 2021-7-15	256945	leon_strive 2024-12-25 09:52
[资料] Scan Chain Design ...2 3 4 5	gangersun 2011-8-19	4115082	leon_strive 2024-12-25 09:50

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