2007 DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS 2nd Edition

squall418 · 发表于 2011-6-27 16:54:51

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Published by Springer,
P.O. Box 17, 3300 AA Dordrecht, The Netherlands.
Printed on acid-free paper
All Rights Reserved
© 2007 Springer

mtwumtwu · 发表于 2011-6-27 18:17:46

good reference for VLSI testing

pedro888 · 发表于 2011-7-1 02:24:11

Thanks for your information......................

Thanks........................

pinpinse · 发表于 2012-11-15 16:47:59

有一个section有兴趣

hanseldsilva3 · 发表于 2012-12-30 03:49:11

good data..........

Syn2012 · 发表于 2013-1-27 01:47:19

Thanks for your sharing!

jimcmwang · 发表于 2018-5-6 00:58:20

2007 Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition .pdf (5.84 MB)

[资料] 2007 DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS 2nd Edition