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资料区 今日: 0|主题: 805|排名: 38 

[求助] 请问有IEEE 1149.1 2013版本么? attachment risccpu 2024-7-10 4761 orwell 2025-1-17 14:12
[资料] Electronic Test Instruments: Theory and Applications KongDu 2025-1-12 1443 soldierwuhan 2025-1-12 08:06
[资料] 《超大规模集成电路测试》 attach_img  ...2345 hua1314 2022-8-20 406550 313949724 2025-1-10 08:09
[资料] ieee1149.1 standard doc attachment wdp1990 2024-1-10 5933 echoeswen 2025-1-9 15:35
[资料] Freescale的DFT培训资料  ...23 gckdren 2010-5-2 298352 elantec 2025-1-9 10:56
[求助] Tetramax ATPG时生成的测试向量很少 attach_img heartzhizi 2016-10-10 66093 yiw_1 2025-1-8 00:37
[转贴] memory test pattern attachment  ...23456 peterlin2010 2018-1-27 5313982 igolaps 2025-1-4 17:42
IC测试原理解析 attachment  ...2 Ghost_xia 2009-3-20 113605 dmf336 2025-1-2 16:46
[原创] High Performance Memory Testing Design Principles, Fault Modeling and Self-Test attachment  ...23456..8 netghost 2010-2-7 7218539 wll_123_hi 2024-12-31 16:18
[资料] VLSI测试与可测性ppt attachment  ...2 lull0815 2010-1-25 166422 sumit_enggr 2024-12-29 16:41
[资料] IEEE 1149.4-2024 attachment zhong1990 2024-12-27 3414 warewise6836 2024-12-27 22:46
[资料] 可用于测试开发高频芯片用的座子 attachment lingmei 2012-5-8 52591 leon_strive 2024-12-27 18:33
减少数字集成电路测试时间的扫描链配置.pdf attachment  ...23 xianxiao 2008-7-5 297618 leon_strive 2024-12-27 18:32
[原创] 边界扫描Flash测试 cigarlover 2013-11-17 42612 leon_strive 2024-12-27 18:31
IC测试原理解析3 attachment Ghost_xia 2009-3-20 93796 leon_strive 2024-12-27 18:26
[资料] IEEE 1149.5-1995 attachment zhong1990 2024-12-27 1314 flyskyseu 2024-12-27 17:37
[求助] 模拟芯片在仿真阶段可以做aging的仿真么? wstorfy 2017-9-22 12384 leon_strive 2024-12-27 17:17
[原创] Soft-Test Fundamentals of Mixed Signal Testing attachment alexchiang 2010-7-1 83892 leon_strive 2024-12-27 17:15
[资料] synopsys DFTC ,Tetramax, Mentor BSDarchitect MBISTarchitect flow2000a 2017-11-8 22468 flyskyseu 2024-12-27 16:51
JTAG测试技术_PCB attachment  ...23456 lemomn 2008-2-3 5713352 leon_strive 2024-12-27 16:49
Device Interface Board for Wireless LAN Testing attachment  ...23 lemomn 2008-2-3 267213 leon_strive 2024-12-27 16:48
[资料] DAC静态参数测试 attachment gangersun 2011-8-19 42815 leon_strive 2024-12-27 16:46
Digital_test attachment smartbear_06 2009-6-9 42450 leon_strive 2024-12-27 16:42
[资料] J750 RFID option boad test RFID TAG CASE attachment Josh_wei 2013-7-2 84446 leon_strive 2024-12-27 16:39
[资料] 刚安装好synopsys ,来分享一波文件,design compiler已经成功安装 attachment deeeeepblue 2017-8-24 82414 leon_strive 2024-12-27 16:38
[资料] 模拟电路版图的艺术中文第二版 attachment  ...23 youbuweige 2020-2-24 256426 leon_strive 2024-12-27 11:25
[资料] IC半导体测试基础--中文版 attachment  ...23456..9 sminyi 2020-3-7 8116259 品博锦取_2021 2024-12-27 10:46
[资料] 半导体测试基础 attachment  ...2 鲨鱼辣椒123 2019-3-19 103151 品博锦取_2021 2024-12-27 10:42
[资料] 超大规模集成电路测试---pdg版 attachment  ...23 wlbce 2012-3-15 266485 leon_strive 2024-12-27 10:34
[资料] Mixed Circuit Test Theory attachment  ...2 gangersun 2011-8-19 174442 leon_strive 2024-12-26 17:45
[新书首发]Production Testing of RF and SoC Devices for Wireless Communications attachment  ...23456..8 AroundSky 2009-9-27 7715264 leon_strive 2024-12-26 17:44
[资料] 2007 DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS 2nd Edition attachment squall418 2011-6-27 73862 leon_strive 2024-12-26 17:43
[求助] 请问parallel仿真的时候波形为什么有shift操作?不应该只有force和capture操作吗? 黑崎一护776 2018-8-1 72663 leon_strive 2024-12-26 17:42
Continuity Test,BasicsOfLowCurrentProbing,静态电流 attachment  ...2 zhongshanli 2008-10-13 185237 leon_strive 2024-12-26 17:41
[资料] 半导体测试项目简介 attachment gangersun 2011-8-19 54018 leon_strive 2024-12-26 17:40
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