2013 spring新书：Design, Analysis and Test of Logic Circuits Under Uncertainty

lvwei_1024 · 发表于 2013-12-7 22:41:22

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Book Description[size=0.86em]Publication Date: September 21, 2012 | ISBN-10: 9048196434 | ISBN-13: 978-9048196432 | Edition: 2013
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
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mac2012 · 发表于 2013-12-7 23:56:04

只有一个下载，很顺利

apteye · 发表于 2013-12-8 18:02:25

Uncertainty

richardxingxing · 发表于 2013-12-9 10:05:39

非常感谢楼主分享

peterlin2010 · 发表于 2013-12-9 15:38:06

網路有個 2M 是
不全
樓主這本才全阿

kylkzy · 发表于 2013-12-9 16:51:42

很好很新！多多益善。

mzsm1 · 发表于 2013-12-10 09:43:01

感谢楼主

xuleiwx · 发表于 2013-12-10 14:09:03

下载看看

lujunfeng111 · 发表于 2013-12-15 21:55:38

非常感谢楼主

chnmy · 发表于 2013-12-17 20:58:32

回复 1# lvwei_1024

不错的书，非确定性下的逻辑电路设计分析和测试，感谢

[原创] 2013 spring新书：Design, Analysis and Test of Logic Circuits Under Uncertainty

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