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Calculation of Total Integrated Noise in Analog Circuits
Dastgheib, A. Murmann, B.
Dept. of Electr. Eng., Stanford Univ., Stanford, CA;
This paper appears in: Circuits and Systems I: Regular Papers, IEEE Transactions on
Publication Date: Nov. 2008
Volume: 55, Issue: 10
On page(s): 2988-2993
ISSN: 1549-8328
INSPEC Accession Number: 10346634
Digital Object Identifier: 10.1109/TCSI.2008.923276
First Published: 2008-04-18
Current Version Published: 2008-11-21 |