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"Advanced CMOS protection device trigger mechanisms during CDM"
This paper appears in:
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1995
Date of Conference: 12 Sep 1995
Author(s): Duvvury, C.
Semicond. Process & Device Center, Texas Instrum. Inc., Dallas, TX
Amerasekera, A.
On Page(s): 162 - 174
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=478281&contentType=Conference+Publications&queryText%3DAdvanced+CMOS+protection+device+trigger+mechanisms+during+CDM
"An anti-snapback circuit technique for inhibiting parasitic bipolar conduction during EOS/ESD events "
http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=818991&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D818991
This paper appears in:
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1999
Date of Conference: 1999
Author(s): Smith, J.C.
Somerset Design Center, Motorola Inc., Austin, TX
On Page(s): 62 - 69 |
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