Performance and Reliability of 2-Transistor FN/FN Flash Arrays with Hafnium Based High-K Inter-Poly Dielectrics for Embedded NVM
this paper appears in:
Non-Volatile Semiconductor Memory Workshop, 2006. IEEE NVSMW 2006. 21st
Date of Conference: 12-16 Feb. 2006
Author(s): van Duuren, M.
Philips Res. Leuven
van Schaijk, R. ; Slotboom, M. ; Tello, P. ; Goarin, P. ; Akil, N. ; Neuilly, F. ; Rittersma, Z. ; Huerta, A.
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发表于 2012-10-12 17:16:05
