在线咨询
eetop公众号 创芯大讲堂 创芯人才网
切换到宽版

EETOP 创芯网论坛 (原名:电子顶级开发网)

手机号码,快捷登录

手机号码,快捷登录

找回密码

  登录   注册  

快捷导航
搜帖子
查看: 2565|回复: 9

Integrated Circuit Test Engineering

[复制链接]
发表于 2009-6-11 19:24:54 | 显示全部楼层 |阅读模式

马上注册,结交更多好友,享用更多功能,让你轻松玩转社区。

您需要 登录 才可以下载或查看,没有账号?注册

x


Ian A. Grout “Integrated Circuit Test Engineering: Modern Techniques"
Springer | 2005-10-21 | ISBN: 1846280230 | 362 pages | PDF | 2,3 MB


Nearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test engineering activities during development and production. Test engineering must also be more closely interwoven with microelectronic design. An understanding of circuit test engineering is vital to any student desiring a career involving any stage in the design or manufacture of integrated circuits.
Taking a three-pronged approach – dealing with test engineering from traditional-test, design and manufacturing view-points – Integrated Circuit Test Engineering encapsulates the subject as it stands today. After an introduction covering background from basic testing rules to trends in technology, the reader learns about:
• fabrication processes;
• a diverse and complete range of detailed tests and procedures calculated to teach you all the tests you will require and how to choose which one(s) to use;
• how to design for testability;
• fault simulation;
• automatic test equipment
• the economics of testing.
From a practical perspective, the text includes:
• A range of worked examples and exercises together with well-organized references and bibliography to aid further enquiry.
• An introduction to various software such as MATLAB® and Spice explaining their use in testing together with that of IEEE-standard hardware-description languages Verilog®-HDL and VHDL.
• A series of experiments based on material which can be freely downloaded from springeronline.com instructing you in the construction of a hardware test arrangement for MS Windows PCs (functionality, schematic and printed-circuit-board layout)with Visual Basic programs to drive the experiments.
Integrated Circuit Test Engineering provides a thorough-going and illuminating introduction to test engineering in analogue, digital and mixed-signal integrated circuits. This text is a valuable practical learning tool for advanced undergraduate and graduate electronic engineering students, an excellent teaching resource for their tutors and a useful guide for the practising electronic engineer.

Integrated Circuit Test Engineering_Ian A. Grout.pdf

2.84 MB, 下载次数: 78 , 下载积分: 资产 -2 信元, 下载支出 2 信元

发表于 2009-6-12 07:36:14 | 显示全部楼层
good, thanks
发表于 2009-6-12 07:38:45 | 显示全部楼层
good, thanks
发表于 2009-6-12 08:42:56 | 显示全部楼层
发表于 2009-6-12 13:50:55 | 显示全部楼层
very good documents, thanks very much for sharing!!!
发表于 2009-6-13 07:45:56 | 显示全部楼层
:victory: :victory:
发表于 2009-6-13 16:12:39 | 显示全部楼层
xie xie !!!!!!!!!!!
发表于 2009-6-22 03:50:57 | 显示全部楼层
Thanks a lot !!!!!!!!!
发表于 2009-6-30 11:11:43 | 显示全部楼层
thanks very much for sharing!!!
发表于 2009-10-27 09:22:57 | 显示全部楼层
Thank u very much! This is what I wanted hungrily!
您需要登录后才可以回帖 登录 | 注册

本版积分规则

关闭

站长推荐 上一条 /2 下一条


小黑屋| 手机版| 关于我们| 联系我们| 在线咨询| 隐私声明| EETOP 创芯网
( 京ICP备:10050787号 京公网安备:11010502037710 )

GMT+8, 2024-11-28 19:01 , Processed in 0.023600 second(s), 9 queries , Gzip On, Redis On.

eetop公众号 创芯大讲堂 创芯人才网
快速回复 返回顶部 返回列表