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ESD Phenomena and Reliability

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发表于 2009-6-11 17:48:34 | 显示全部楼层 |阅读模式

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This white paper addresses the importance of ESD on Electronic Circuits. The objective
is to present an insight into the present-day phenomena, an overview of its effects on
electronic chips and systems, and a summary of the future issues and challenges facing
ESD reliability as further advances in the semiconductor technologies are made.
With contributions from several leading experts in the different areas of the field, the
state-of-the-art information about ESD is presented here in different chapters. These
include details of controlling the ESD threat from the factory point of view to designing
ESD on the IC chip itself. They also cover the methods to measure and test the ESD
levels, the impact of the advanced IC technologies, simulation of the ESD effects, and
finally the real challenges facing the ESD reliability for the next decade.
It is intended that this white paper will inform the reader about the serious nature of ESD
for the next generation of electronics and subsequently the urgent need to make further
research to maintain safe operation of these devices, whether they may be for
consumer, industrial, military, or medical applications. It is further aimed that research
organizations and government agencies will benefit from the contents of this document
to allow for funding and encouragement of research and development in ESD.

ESD Phenomena and the Reliability for Microelectronics.pdf

226.32 KB, 下载次数: 54 , 下载积分: 资产 -2 信元, 下载支出 2 信元

发表于 2009-6-14 21:55:09 | 显示全部楼层
Good ESD materials. Thanks for sharing!
发表于 2010-8-5 15:41:16 | 显示全部楼层
thanks for your sharing
发表于 2018-12-30 21:48:51 | 显示全部楼层
回复 1# adf_528


    谢谢谢谢谢
发表于 2019-1-2 20:36:08 | 显示全部楼层
Thanks for the sharing.
发表于 2021-2-5 15:18:57 | 显示全部楼层
thanks for sharing
发表于 2022-4-24 01:29:41 | 显示全部楼层
Thanks for sharing
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