[推荐]Semiconductor Failure Analysis ( OBIRCH )

robinson · 发表于 2004-12-20 19:01:40

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LBSALE[5]LBSALE...............
When the laser beam with energy higher than the band gap energy of the pn junction irradiates semiconductor devices, electron-hall pairs are generated and they flow in the semiconductor to make electron current. Detecting this current and displaying on a viewing screen, we obtain OBIC image, and they are used for failure analysis of semiconductor devices.
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power-twq · 发表于 2005-7-15 22:55:03

多谢多谢

tomsen2004 · 发表于 2005-8-5 12:18:23

thanks

lsw0908 · 发表于 2006-4-15 15:46:38

thanks

holmes · 发表于 2006-4-18 20:11:57

这个东西怎么样？

fengluan83 · 发表于 2006-4-19 18:40:16

thanks

ic魅影 · 发表于 2006-4-21 19:29:06

thank you

树上开花 · 发表于 2006-4-23 00:58:14

thanks

everset · 发表于 2006-5-28 17:27:20

我喜欢

liefzhang · 发表于 2006-6-10 21:05:40

多谢多谢

[推荐]Semiconductor Failure Analysis ( OBIRCH )

马上注册，结交更多好友，享用更多功能，让你轻松玩转社区。

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