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发表于 2005-9-13 01:53:32
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请问DFT后仿真的问题?
My understanding of your DFT is mainly scan chain insertion so
I won't talk about Other DFT logics (such as PLL DFT, ram DFT).
Scan insertion introduce new inputs/outputs:
1. dedicated inputs/outputs: scan clock (if not shared), scan test enable
2. scan in and scan out, typically shared with normal input/output pins
you need to disable scan to simulate normal operation modes after DFT. If
you leave them floating, e.g. scan enable test, normal operation mode would
be corrupted.
After DFT, you must generate new timing files (SDF, SPEF ..) and re-run STA.
Hence another possibility is: the new SDF file with DFT is corrupted.
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