柯明道－overcome latchup failure of a power controller IC

semico_ljj · 发表于 2007-9-6 17:14:53

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論文名稱

Failure analysis and solutions to overcome latchup failure event of a power controller IC in bulk CMOS technology

期刊	S.-H. Chen and Ming-Dou Ker, “On-panel output buffer with offset compensation technique for data driver in LTPS technology,”Microelectronics Reliability, vol. 46, no. 7, pp. 1042-1049, Jul. 2006
摘要	Latchup failure which occurred at only one output pin of a power controller IC product is investigated in this work. The special design requirement of the internal circuits causes the parasitic diode that is inherent between the n-well and p-substrate to be a triggering source of the latchup occurrence in this IC. The parasitic diode of the internal PMOS was easily turned on by an anomalous external signal to trigger the neighbor parasitic Silicon Controlled Rectifier (SCR) path which causes latchup event in the CMOS IC product. Some solutions to overcome this latchup failure have been also proposed in this paper.

elliot_cai · 发表于 2008-6-18 09:21:02

好东西！

yihsinkaku1 · 发表于 2009-10-4 19:59:01

奇怪
這篇在台灣的博碩士論文圖書館竟找不到
只能在這裏抓...

rommelhitler · 发表于 2009-10-6 22:53:59

Thanks a lot!

liming7516 · 发表于 2010-11-14 21:15:26

好东西！

xiaotanglang · 发表于 2010-11-15 16:39:16

nice paper

langzijian2006 · 发表于 2010-11-16 09:54:53

thanks～～～

xp212125o · 发表于 2010-11-18 23:06:28

thank you ~

wangjianping · 发表于 2011-1-21 14:30:01

回复 1# semico_ljj

wangjianping · 发表于 2011-1-21 14:35:02

回复 9# wangjianping

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