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Waveform Measurement and Analysis Technical Committee
of the
IEEE Instrumentation and Measurement Society
Approved 7 December 2000
IEEE-SA Standards Board
Abstract: IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and
provides test methods with which to perform the required error measurements. The information in
this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for
evaluating and comparing existing devices, as well as providing a template for writing specifications
for the procurement of new ones. In some applications, the information provided by the tests
described in this standard can be used to correct ADC errors, e.g., correction for gain and
offset errors. This standard also presents terminology and definitions to aid the user in defining and
testing ADCs.
Keywords: ADC, A/D converter, analog-to-digital converter, digitizer, terminology, test methods |
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发表于 2007-7-9 09:17:06
