[springer]Analog IC Reliability in Nanometer CMOS

populbb

Analog IC Reliability in Nanometer CMOS
Series: Analog Circuits and Signal Processing

Maricau, Elie, Gielen, Georges

2013, XVI, 198 p. 95 illus., 27 illus. in color.

Enables readers to understand long-term reliability of an integrated circuit                                                                         Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes                                                                         Provides overview of models for key aging effects, as well as compact models that can be included in a circuit simulator, with model parameters for advanced CMOS technology                                                                         Describes existing reliability simulators, along with techniques to analyze the impact of process variations and aging on an arbitrary analog circuit                                
This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.

The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.

·         Enables readers to understand long-term reliability of an integrated circuit;
·         Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes;
·         Provides overview of models for key aging effects, as well as compact models that can be included in a circuit simulator, with model parameters for advanced CMOS technology;
·         Describes existing reliability simulators, along with techniques to analyze the impact of process variations and aging on an arbitrary analog circuit.

Table of contents (8 chapters)
chapter 1  Introduction
chapter 2  CMOS Reliability Overview
chapter 3  Transistor Aging Compact Modeling
chapter 4  Background on IC Reliability Simulation
chapter 5  Analog IC Reliability Simulation
chapter 6  Integrated Circuit Reliability
chapter 7  Conclusions
Analog IC Reliability in Nanometer CMOS.zip (4.77 MB, 下载次数: 892 )

2013-7-1 21:56 上传

点击文件名下载附件

shuming221

推一個

apteye

滔滔不绝

wangjin0215

kankan，xiexie。。。。。。。

shucai

回复 1# populbb

这话题不错，值得看看

fixit

下载学习

bear7679

太感謝樓主了。

xuleiwx

Springer的书，看看。

bt01234

太感謝樓主了。

mylove2

回复 1# populbb


   多谢！新书呢