JSSCC - Parametric Mismatch Characterization for Mixed-Signal Technologies

jhnkeren · 发表于 2012-3-21 21:47:33

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hi_china59 · 发表于 2012-3-21 22:28:55

本帖最后由 hi_china59 于 2012-3-21 22:32 编辑

IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 45, NO. 9, SEPTEMBER 2010
Parametric Mismatch Characterization for Mixed-Signal Technologies
Hans Tuinhout, Nicole Wils, and Pietro Andricciola

Abstract—Systematic and random parametric mismatches
are major performance limiters as well as notorious causes for
redesigns of high precision mixed-signal circuits and systems.
Therefore, it is extremely important to measure, analyze, interpret,
model and document parametric mismatch mechanisms
meticulously for mixed-signal technologies. This paper gives an
overview of the main requirements and techniques for mismatch
characterization of active and passive devices in deep submicron
mixed-signal IC technologies.
Index Terms—Device modeling, matching, mismatch, random
parametric mismatch fluctuations, silicon device characterization,
systematic mismatch.

Jason_ke · 发表于 2012-3-22 18:13:44

It is very powerful in mismatch!Thanks!

rollstone · 发表于 2012-5-7 11:28:03

It is very powerful in mismatch!Thanks!

xuleiwx · 发表于 2012-8-13 17:14:40

下载看看

udbiclq · 发表于 2012-8-27 14:49:29

下载看看，正遇到这方面的问题、

chenyingping · 发表于 2013-3-28 17:25:31

回复 1# jhnkeren

ding

lupo · 发表于 2013-3-29 10:50:46

Mismatch

dake1025 · 发表于 2013-11-13 10:03:29

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hujiaomianhao · 发表于 2014-11-29 23:55:19

HAO DONG XI!!!

[原创] JSSCC - Parametric Mismatch Characterization for Mixed-Signal Technologies

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