100信元跪求论文 “Studies of EOS susceptibility in 0.6 μm nMOS ESD...”

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"Studies of EOS susceptibility in 0.6 μm nMOS ESD I/O protection structures "

• Carlos H. Díaz
  
                                 
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  , a,
• Charvaka Duvvuryb,
• Sung-Mo Kangc

• a Integrated Circuits Business Division, Technology Development Center, Hewletr-Packard Co., 3500 Deer Creek Road, MS26-U8, Palo Alto, CA 94303-0867, USA
• b Texas Instruments Incorporated, Semiconductor Process Design Center, M/S 461, P.O. Box 655012, Dallas, TX 75265, USA
• c University of Illinois at Urbana-Champaign, Coordinated Science Laboratory, 1308 West Main Street, Urbana, IL 61801, USA

• Received 29 October 1993. Accepted 13 April 1994. Available online 12 February 2003.

http://www.sciencedirect.com/science/article/pii/0304388694900353

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analogmind

自己顶一下

analogmind

自己顶一下