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请帮忙下载以下IEEE standard， 万分感谢！
1) 1149.7-2009
IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture
2)P1149.4/D14, Apr 2009
Standard for a Mixed-Signal Test Bus
3) 1149.4-1999
IEEE Standard for a Mixed-Signal Test Bus
4) 1450.6.1-2009
IEEE Standard for Describing On-Chip Scan Compression
5) IEC 62525:2007 (E), IEEE 1450-2007
IEC Standard Test Inerface Language (STIL) for Digital Test Vector Data
6) 1450.3-2007
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Tester Target Specification
7) 1450.1-2005
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450 /SUP TM/ 1999) for Semiconductor Design Environments |
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发表于 2011-12-2 11:04:12
