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leehd

Photon Beam Damage and Charging at Solid Surfaces John H. Thomas III 1. Introduction Particle-excited surface spectroscopies such as Rutherford backscattering (RBS), secondary-ion mass spectrometry (SIMS), and Auger electron spectroscopy (AES) produce data that may be strongly affected by the interaction of a particle (ion, electron, etc.) with the solid surface of the sample. However, when X-ray excited spectroscopy is applied to organics, and to some inorganic polymeric materials, photon absorption can result in materials modification and, in some cases, decomposition. Paul, MN 55144. Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis, edited by Czanderna et al. If the sample consists of a heterogeneous mixture of insulating particles containing common elements such as in differential charging would be expected. The accelerating voltage and filament current (controlling the emission current) are externally adjustable.

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