Essentials of Electronic Testing for Digital VLSI Circuits

fengqiao1981

《Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits》
(Frontiers in Electronic Testing Volume 17) (Frontiers in Electronic Testing)

【原书作者】： Michael L. Bushnell（Rutgers University）， Vishwani D. Agrawal（Bell Labs, Lucent Technologies.）
【ISBN 】： 0792379918
【页数 】：712
【开本 】 ：
【出版社】 ：KLUWER ACADEMIC PUBLISHERS
【出版日期】：2002
【文件格式】：PDF
【封面附图】：

【摘要或目录】：
Book Description
Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means `meeting the user's needs at a minimum cost.' The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip.

The book consists of:
Part I: Introduction, Test Process and ATE, Test Economics and Product Quality, Fault Modeling;
Part II: Logic and Fault Simulation, Testability Measures, Combinatorial ATPG, Sequential ATPG, Memory Test, DSP-Based Analog Test, Model-Based Analog Test, Delay Test, IDDQ Test;
Part III: DFT and Scan Design, BIST, Boundary Scan, Analog Test Bus, System Test and Core-Based Design, Future Testing;
Appendices: Cyclic Redundancy Code Theory, Primitive Polynomials, Books on Testing; Bibliography: over 700 entries.

Book Info
Provides a careful selection of essential topics on the three types of circuits, digital, memory, and mixed signal. A basic textbook for a course on testing and a testability guide for practicing engineers, with a bibliography of over 700 entries. DLC: Integrated circuits.

Table of contents
Preface. About the Authors.
I: Introduction to Testing.
1. Introduction.
2. VLSI Testing Process and Test Equipment.
3. Test Economics and Product Quality.
4. Fault Modeling.

II: Test Methods.
5. Logic and Fault Simulation.
6. Testability Measures.
7. Combinational Circuit Test Generation.
8. Sequential Circuit Test Generation.
9. Memory Test. 10. DSP-Based Analog and Mixed-Signal Test.
11. Model-Based Analog and Mixed-Signal Test.
12. Delay Test. 13. IDDQ Test.

III: Design for Testability.
14. Digital DFT and Scan Design.
15. Built-In Self-Test.
16. Boundary Scan Standard.
17. Analog Test Bus Standard.
18. System Test and Core-Based Design.
19. The Future of Testing.

Appendix
A: Cyclic Redundancy Code Theory.
B: Primitive Polynomials of Degree 1 to 100.
C: Books on Testing. Bibliography.
Index.

apteye

thanks

kevin20899

感謝!!!

hisilicon_boy

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frankqs

下载在那里呢？
赫赫！
谢谢！

ycjane

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risccpu

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risccpu

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risccpu

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haomine2010