Essentials of Electronic Testing for Digital VLSI Circuits

liuwenye2010 · 发表于 2015-4-4 15:50:28

good, I like this book. also buy the Chinese edition.

jimcmwang · 发表于 2015-4-7 22:47:44

[资料] Essentials of Electronic Testing for Digital VLSI Circuits

design
《Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits》
(Frontiers in Electronic Testing Volume 17) (Frontiers in Electronic Testing)

【原书作者】： Michael L. Bushnell（Rutgers University）， Vishwani D. Agrawal（Bell Labs, Lucent Technologies.）
【ISBN 】： 0792379918
【页数】：712
【开本】：
【出版社】：KLUWER ACADEMIC PUBLISHERS
【出版日期】：2002
【文件格式】：PDF
【封面附图】：

【摘要或目录】：
Book Description
Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means `meeting the user's needs at a minimum cost.' The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip.

The book consists of:
Part I: Introduction, Test Process and ATE, Test Economics and Product Quality, Fault Modeling;
Part II: Logic and Fault Simulation, Testability Measures, Combinatorial ATPG, Sequential ATPG, Memory Test, DSP-Based Analog Test, Model-Based Analog Test, Delay Test, IDDQ Test;
Part III: DFT and Scan Design, BIST, Boundary Scan, Analog Test Bus, System Test and Core-Based Design, Future Testing;
Appendices: Cyclic Redundancy Code Theory, Primitive Polynomials, Books on Testing; Bibliography: over 700 entries.

Book Info
Provides a careful selection of essential topics on the three types of circuits, digital, memory, and mixed signal. A basic textbook for a course on testing and a testability guide for practicing engineers, with a bibliography of over 700 entries. DLC: Integrated circuits.

Table of contents
Preface. About the Authors.
I: Introduction to Testing.
1. Introduction.
2. VLSI Testing Process and Test Equipment.
3. Test Economics and Product Quality.
4. Fault Modeling.

II: Test Methods.
5. Logic and Fault Simulation.
6. Testability Measures.
7. Combinational Circuit Test Generation.
8. Sequential Circuit Test Generation.
9. Memory Test. 10. DSP-Based Analog and Mixed-Signal Test.
11. Model-Based Analog and Mixed-Signal Test.
12. Delay Test. 13. IDDQ Test.

III: Design for Testability.
14. Digital DFT and Scan Design.
15. Built-In Self-Test.
16. Boundary Scan Standard.
17. Analog Test Bus Standard.
18. System Test and Core-Based Design.
19. The Future of Testing.

Appendix
A: Cyclic Redundancy Code Theory.
B: Primitive Polynomials of Degree 1 to 100.
C: Books on Testing. Bibliography.
Index.