Wafer-level Testing and Test During Burn-in for Integrated Circuits

squall418 · 发表于 2011-6-22 20:48:05

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Wafer-Level Testing and Test
During Burn-In for Integrated Circuits
Sudarshan Bahukudumbi
Krishnendu Chakrabarty

cgc112 · 发表于 2011-6-22 23:17:30

谢谢~

mtwumtwu · 发表于 2011-6-23 10:23:42

Good reference for design for test

lazyflog · 发表于 2011-6-23 10:49:23

for learning ,thanks!

risccpu · 发表于 2011-6-23 15:05:14

good.

daojx · 发表于 2011-6-23 18:18:36

great, thanks!

myings · 发表于 2011-6-24 10:39:49

thanks for your sharing!!!!!!!!!!!!

fixit · 发表于 2011-6-26 10:45:50

thanks a lot

alenanderson · 发表于 2011-6-29 23:06:37

THanks for sharing

pedro888 · 发表于 2011-7-1 02:17:39

Thanks for your information...................

Thanks.................

[资料] Wafer-level Testing and Test During Burn-in for Integrated Circuits