在使用DFT做ATPG时scan chain问题

xiaoquhengqilai

在使用Modus工具做atpg时，在verify_test_structure步骤中，报了TSV-400和TSV-571的warning

即observable scan chain ending at pin A[1] is not a controllable scan chain, the last observation flop that was found in the scan chain is unidentified.
a scan in pin B[1] does not feed to a scan out, a multiple-input signature register ( MISR ) input, pattern generator, or a controllable latch

同时会报告TSV-311的severe warning，运行停止
即 more than one clock input to memory element blobk ABC is not off ( at logic zero ) during the scan operation

有没有大佬指点一下
这是不是跟assign file中指定的SE有关，因为我用gui去查看的时候发现，一些module的DFT_se信号的source为0，像是只有一条悬空的线