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論文名稱 | Overview on electrostatic discharge protection designs for mixed-voltage I/O interfaces: design concept and circuit implementations |
期刊 | Ming-Dou Ker and K.-H. Lin, Overview on electrostatic discharge protection designs for mixed-voltage I/O interfaces: design concept and circuit implementations, IEEE Trans. on Circuits and Systems I: Regular Papers, vol. 53, no. 2, pp. 235-246, Feb. 2006 | 摘要 | Electrostatic discharge (ESD) protection design for mixed-voltage I/O interfaces has been one of the key challenges of system-on-a-chip (SOC) implementation in nano-scale CMOSprocesses. The on-chip ESD protection circuit for mixed-voltage I/O interfaces should meet the gate-oxide reliability constraints and prevent the undesired leakage current paths. This paper presents an overview on the design concept and circuit implementations of the ESD protection designs for mixed-voltage I/O interfaces without using the additional thick gate-oxide process. The ESD design constraints in mixed-voltage I/O interfaces, the classification and analysis of ESD protection designs for mixed-voltage I/O interfaces, and the designs of high-voltage-tolerant power-rail ESD clamp circuit are presented and discussed. | 關鍵字 | Electrostatic discharge (ESD), ESD protection
design, gate-oxide reliability, high-voltage tolerant, mixed-voltage
I/O interfaces, power-rail ESD clamp circuit. |
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