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論文名稱 | Self-substrate-triggered technique to enhance turn-on uniformity of multi-finger ESD protection devices |
期刊 | Ming-Dou Ker and J.-H. Chen, “Self-substrate-triggered technique to enhance turn-on uniformity of multi-finger ESD protection devices,”IEEE Journal of Solid-State Circuits, vol. 41, no. 11, pp. 2601-2609, Nov. 2006. | 摘要 | A new power-rail electrostatic discharge (ESD) clamp circuit for application in 3.3-V mixed-voltage input–output (I/O) interface is proposed and verified in a 130-nm 1-V/2.5-V CMOS process. The devices in this power-rail ESD clamp circuit are all 1-V or 2.5-V low-voltage nMOS/pMOS devices, which are specially designed without suffering the gate-oxide reliability issue under 3.3-V I/O interface applications. A special ESD detection circuit realized with the low-voltage devices is designed and added in the power-rail ESD clamp circuit to improve ESD robustness of ESD clamp devices by substrate-triggered technique. The experimental results verified in a 130-nm CMOS process have proven the excellent effectiveness of this new proposed power-rail ESD clamp circuit. | 關鍵字 | Electrostatic discharge (ESD), ESD protection
circuit, high-voltage tolerant, power-rail ESD clamp circuit, substrate-triggered technique. |
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