1. Fundamental Noise Mechanisms (5) |
1.1. Noise Definition (5) |
1.2. Noise Properties (6) |
1.3. Thermal Noise (8) |
1.4. Noise Bandwidth (11) |
1.5. Thermal Noise Equivalent Circuits (17) |
1.6. Addition of Noise Voltages (18) |
1.7. Correlation (21) |
1.8. Noise Circuit Analysis (22) |
1.9. Excess Noise (25) |
1.10. Low-Frequency Noise (25) |
1.11. Shot Noise (27) |
1.12. Capacitance Shunting of Thermal Noise: kT/C Noise (30) |
Summary (32) |
Problems (32) |
References (37) |
2. Amplifier Noise Model (38) |
2.1. The Noise Voltage and Current Model (38) |
2.2. Equivalent Input Noise (39) |
2.3. Measurement of En and In (41) |
2.4. Input Noise Examples (42) |
2.5. Noise Figure (NF) and Signal-to-Noise Ratio (SNR) (44) |
2.6. Optimum Source Resistance (45) |
2.7. Noise Resistance and Noise Temperature (46) |
2.8. Noise in Cascaded Networks (47) |
Summary (48) |
Problems (49) |
References (52) |
3. Noise in Feedback Amplifiers (53) |
3.1. Noise and Some Basic Feedback Principles (53) |
3.2. Amplifier Noise Model for Differential Inputs (55) |
3.3. Inverting Negative Feedback (63) |
3.4. Noninverting Negative Feedback (65) |
3.5. Positive Feedback (67) |
Summary (69) |
Problems (70) |
References (75) |
PART II. NOISE MODELING |
4. Cad for Noise Analysis (79) |
4.1. History of SPICE (81) |
4.2. SPICE Capabilities (81) |
4.3. SPICE Description (81) |
4.4. Amplifier Noise Sources (83) |
4.5. Modeling 1/f Noise (86) |
4.6. Modeling Excess Noise (88) |
4.7. Random Noise Generator (95) |
4.8. Finding Noise Bandwidth Using PSpice (98) |
4.9. Integrating Noise over a Frequency Bandwidth (101) |
4.10. Model Reduction Techniques (103) |
Summary (104) |
Problems (104) |
References (107) |
5. Noise in Bipolar Transistors (109) |
5.1. Hybrid-π Model (109) |
5.2. Noise Model (112) |
5.3. Equivalent Input Noise (114) |
5.4. Noise Voltage and Noise Current Model (116) |
5.5. Limiting Case for Midband Noise (119) |
5.6. Minimizing the Noise Factor (120) |
5.7. 1/f Noise Region (122) |
5.8. Noise Variation with Operating Point (123) |
5.9. Burst or Popcorn Noise (126) |
5.10. Popcorn Noise Measurement (129) |
5.11. Reliability and Noise (132) |
5.12. Avalanche Breakdown and Noise (133) |
Summary (136) |
Problems (137) |
References (139) |
6. Noise in Field Effect Transistors (140) |
6.1. FET Noise Mechanisms (141) |
6.2. Noise in MOSFEs (146) |
6.3. Noise in JFETs (152) |
6.4. Noise in GaAs FETs (154) |
6.5. Measuring FET Noise (164) |
Summary (168) |
Problems (168) |
References (170) |
7. System Noise Modeling (172) |
7.1. Noise Modeling (172) |
7.2. A General Noise Model (173) |
7.3. Effect of Parallel Load Resistance (175) |
7.4. Effect of Shunt Capacitance (177) |
7.5. Noise of a Resonant Circuit (178) |
7.6. PSpice Example (179) |
Summary (181) |
Problems (182) |
Reference (183) |
8. Sensors (184) |
8.1. Voltaic Sensor (185) |
8.2. Biased Resistive Sensor (186) |
8.3. Optoelectronic Detector (188) |
8.4. RLC Sensor Model (194) |
8.5. Piezoelectric Transducer (196) |
8.6. Transformer Model (198) |
Summary (202) |
Problems (203) |
References (204) |
PART III. DESIGNING FOR LOW NOISE |
9. Low-Noise Design Methodology (207) |
9.1. Circuit Design (207) |
9.2. Design Procedure (208) |
9.3. Selection of an Active Device (210) |
9.4. Designing with Feedback (212) |
9.5. Bandwidth and Source Requirements (213) |
9.6. Equivalent Input Noise (214) |
9.7. Transformer Coupling (217) |
9.8. Design Examples (218) |
Summary (221) |
Problems (221) |
10. Amplifier Design (223) |
10.1. Transistor Configurations (224) |
10.2. Common-Emitter Stage (225) |
10.3. Single-Supply Common-Emitter Stage (227) |
10.4. Noise in Cascaded Stages (231) |
10.5. Common-Source-Common-Emitter Pair (232) |
10.6. Common-Collector-Common-Emitter Pair (234) |
10.7. Common-Emitter-Common-Base Pair (236) |
10.8. Integrated BJT Cascode Amplifier (237) |
10.9. Differential Amplifier (239) |
10.10. Parallel Amplifier Stages (245) |
10.11. IC Amplifiers (246) |
Summary (248) |
Problems (249) |
References (251) |
11. Noise Analysis of D/A and A/D Converters (252) |
11.1. Resistor Networks for D/A Converters (253) |
11.2. Noise Analysis of D/A Converter Circuits (255) |
11.3. D/A SPICE Simulations (261) |
11.4. Noise in a Flash A/D Converter (269) |
11.5. A/D SPICE Simulations (272) |
11.6. Converting Analog Noise to Bit Errors (275) |
11.7. Bit Error Analysis of the Flash Converter (279) |
11.8. A/D/A Noise Analysis (282) |
Summary (283) |
Problems (283) |
References (284) |
PART IV. LOW-NOISE DESIGN APPLICATIONS |
12. Noise in Passive Components (289) |
12.1. Resistor Noise (289) |
12.2. Noise in Capacitors (296) |
12.3. Noise of Reference and regulator Diodes (297) |
12.4. Batteries (299) |
12.5. Noise Effects of Coupling Transformers (299) |
Summary (304) |
Problems (304) |
References (305) |
13. Power Supplies and Voltage References (306) |
13.1. Transformer Common-Mode Coupling (306) |
13.2. Power Supply Noise Filtering (308) |
13.3. Capacity Multiplier Filter (309) |
13.4. Noise Clipper (310) |
13.5. Regulated Power Supplies (310) |
13.6. Integrated Circuit Voltage Reference (312) |
13.7. Bandgap Voltage Reference (324) |
Summary (327) |
Problems (328) |
References (329) |
14. Low-Noise Amplifier Design Examples (330) |
14.1. Cascade Amplifier (330) |
14.2. Cascode Amplifier (332) |
14.3. General-Purpose Laboratory Amplifier (333) |
14.4. IC Amplifier with Discrete Input Stages (334) |
14.5. Direct-Coupled Single-Ended Amplifier (335) |
14.6. ac-Coupled Single-Ended Amplifier (336) |
Summary (337) |
References (337) |
15. Noise Measurement (339) |
15.1. Two Methods for Noise Measurement (339) |
15.2. Sine Wave Method (340) |
15.3. Noise Measurement Equipment (346) |
15.4. Noise Generator Method (356) |
15.5. Comparison of Methods (361) |
15.6. Effect of Measuring Time on Accuracy (361) |
15.7. Bandwidth Errors in Spot Noise Measurements (362) |
15.8. Noise Bandwidth (364) |
Summary (365) |
Problems (366) |
References (367) |
Appendix A. Measured Noise Characteristics of Integrated Amplifiers (368) |
Appendix B. Measured Noise Characteristics of Field Effect Transistors (377) |
Appendix C. Measured Noise Characteristics of Bipolar Junction Transistors (385) |
Appendix D. Random Number Generator Program (400) |
Appendix E. Answers to Selected Problems (406) |
Appendix F. symbol Definitions (411) |