Theme 1: DC Measurements
•
Challenges •
Data Verification
Theme 2: CV Measurements
•
Applying LCRZ Meters
Theme 3: S-ParameterMeasurements
•
Direct Interpretation of S-Parameter Measurements •
Guide for Verified S-Parameter Measurements
Theme 4: 1/f Noise
•
Measurements and Data Verification
Theme 5: Parameter Extraction Techniques
•
Regression Analysis •
Visual Parameter Extraction
Theme 6: Fundamentals of Device Modeling
•
Diode (DC -> CV -> S-parameter -> nonlinear RF) •
HEMT Transistor Modeling (Angelov) •
Passive Device Modeling: model development •
based on measurement results
self heating
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