使用TSMC018工艺,在标准单元版图里面,比如反相器,感觉nwell没有阱接触,图如下
采用这些标准单元进行设计,到DRC的时候出现了上万个下面的关于闩锁的错误:
LUP.6 { @ Any point inside NMOS source/drain space to the nearest PW STRAP in the same PW <= 30 um
@ Any point inside PMOS source/drain space to the nearest NW STRAP in the same NW <= 30 um
@ In SRAM bit cell region, the rule is relaxed to 40 um
PACT_CHECK_NON_SRAM NOT NSTP_OS
PACT_CHECK_SRAM NOT (NSTP_OS OR NSTP_OS_SRAM)
NACT_CHECK_NON_SRAM NOT PSTP_OS
NACT_CHECK_SRAM NOT (PSTP_OS OR PSTP_OS_SRAM)