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Design for Reliability of Low-voltage,
Switched-capacitor Circuits
Abstract
by
Andrew Masami Abo
Doctor of Philosophy in Engineering
University of California, Berkeley
Professor Paul R. Gray, Chair
Analog, switched-capacitor circuits play a critical role in mixed-signal, analogto-
digital interfaces. They implement a large class of functions, such as sampling,
filtering, and digitization. Furthermore, their implementation makes them
suitable for integration with complex, digital-signal-processing blocks in a compatible,
low-cost technology–particularly CMOS. Even as an increasingly larger
amount of signal processing is done in the digital domain, this critical, analogto-
digital interface is fundamentally necessary. Examples of some integrated applications
include camcorders, wireless LAN transceivers, digital set-top boxes,
and others.
Advances in CMOS technology, however, are driving the operating voltage of
integrated circuits increasingly lower. As device dimensions shrink, the applied
voltages will need to be proportionately scaled in order to guarantee long-term
reliability and manage power density.
The reliability constraints of the technology dictate that the analog circuitry
operate at the same low voltage as the digital circuitry. Furthermore, in achieving
low-voltage operation, the reliability constraints of the technology must not be
violated.
This work examines the voltage limitations of CMOS technology and how analog
circuits can maximize the utility of MOS devices without degrading reliability. An
emphasis is placed on providing circuit solutions that do not require
process enhancements. The specific research contributions of this work include
(1) identifying the MOS device reliability issues that are relevant to switchedcapacitor
circuits, (2) introduction of a new bootstrap technique for operating
MOS transmission gates on a low voltage supply without significantly degrading
device lifetime, (3) development of low-voltage opamp design techniques. With
these design techniques building blocks necessary for switched-capacitor circuits
can be implemented, enabling the creation of sampling, filtering, and data conversion
circuits on low-voltage supplies. As a demonstration, the design and characterization
of an experimental 1.5V, 10-bit, 14.3MS/s, CMOS pipeline analogto-
digital converter is presented.
Paul R. Gray
[ 本帖最后由 semico_ljj 于 2006-11-17 15:11 编辑 ] |
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