| | | | Node locked software based licensing to ease your license management and reduce the security cost involved in software development. | |
| | | | Supports Windows 2000/XP and new Windows 7 (32/64 bit). | |
| | | | Introduction of 32nm & 45nm technology design rule file with their application notes. | |
| | | | Added a new screen for process/Voltage/Temperature Min, Typ, max modes. | |
| | | | Zoom In Navigator added at bottom of the palette that eases the navigation in the case of very large designs. | |
| | | | A spectacular command '3D View of the IC' which enables to draw real-time images of the layout and navigate in fill-3D on the surface or inside the IC based on OpenGL and offers outstanding picture quality. | |
| | | | Metallization macros which ease the addition of contacts in the layout have been updated to handle up to 8 layers of metal especially for 45nm technology. | |
| | | | Totally new companion software tutorial 'silicon' to give a user's controlled 3D view of silicon atoms such as SiO2 and carbon nanotubes. | |
| | | | Improved Global Delay Evaluation at integrated circuit level. | |
| | | | Enhanced Global Crosstalk evaluation effect based on analytical approximations of the coupling amplitude. | |
| | | | Improved and new Help on Design Rules. | |
| | | | Improve drawing speed (specifically pads) with very large screen resolution. | |
| | | | Improved 3D views for 65, 45 and 32nm technologies based on Intel/Ibm technologies. | |
| | | | Improved Microwind/Dsch 3.5 manual including some new features (Ion/Ioff, PVT variations) | |
| | | | DSCH : Added a tool on fault analysis at the gate level of digital. Faults: Stuck-1, stuck-at-0. The technique allows injection of single stuck-at fault at the nodes of the circuit. | |
| | | | DSCH : Improved interface between DSCH and Winspice. | |
| | | | ..many more improvements in software function & operation.
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eetop公众号
创芯大讲堂
创芯人才网
发表于 2011-10-29 21:49:24
