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发表于 2011-10-13 18:29:32
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It depends on testing requirements. Bist controller controls a cain of collars and within the collar you can have more than one memory cut and can be tested in sequential way (less power, more testing time) or in parallel (more power, less testing time). For multibank memories, i use 4 cuts per collar, and up to collar per BIST controller.
However there is huge degree of freedom on that, it depends on the testing time you want to spend on the ATE. |
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