IC test golden book

chen600 · 发表于 2016-3-24 14:29:08

好多资料，谢谢

jimcmwang · 发表于 2016-4-1 21:18:40

analog_test_methods.pdf (234.48 KB)

chinese_SAADC.pdf (305.38 KB)

IEEE_P1500_Boundary_Scan_for_SoCs.pdf (126.02 KB)

jimcmwang · 发表于 2016-4-1 22:27:24

analog_test_methods.pdf (234.48 KB)

chinese_SAADC.pdf (305.38 KB)

IEEE_P1500_Boundary_Scan_for_SoCs.pdf (126.02 KB)

edgargong2010 · 发表于 2016-4-7 00:46:45

Thanks a lot

godmoom · 发表于 2016-4-12 15:42:59

谢谢分享

fang987120 · 发表于 2016-4-12 22:32:49

不错，刚入职做测试正好拿来自己研究下

jimcmwang · 发表于 2016-7-26 20:42:31

analog_test_methods.pdf (234.48 KB)

chinese_SAADC.pdf (305.38 KB)

IEEE_P1500_Boundary_Scan_for_SoCs.pdf (126.02 KB)

jimcmwang · 发表于 2016-7-26 20:43:40

analog_test_methods.pdf (234.48 KB)

chinese_SAADC.pdf (305.38 KB)

IEEE_P1500_Boundary_Scan_for_SoCs.pdf (126.02 KB)

jimcmwang · 发表于 2016-7-26 20:45:52

analog_test_methods.pdf (234.48 KB)

chinese_SAADC.pdf (305.38 KB)

IEEE_P1500_Boundary_Scan_for_SoCs.pdf (126.02 KB)

pxj0557 · 发表于 2016-9-20 14:48:10

学习一下，谢谢分享！！！

[资料] IC test golden book