[高清晰版]VLSI Test Principles and Architectures Design for Testability

dendrite

VLSI Test Principles and Architectures Design for TestabilityHardcover: 808 pages Publisher: Morgan Kaufmann; 1 edition (July 21, 2006) Language: English ISBN-10: 0123705975 ISBN-13: 978-0123705976
In the era of large systems embedded in a single system-on-chip (SOC) and fabricated continuously shrinking technologies, it is important to ensure correct behavior of the whole system. Electronic design and test engineers of today have to deal with these complex and heterogeneous systems (digital, mixed-signal, memory), but few have the possibility to study the whole field in a detailed and deep way. This book provides an extremely broad knowledge of the discipline, covering the fundamentals in detail, as well as the most recent and advanced concepts.

humann

good book

wafergao

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wafergao

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pedro888

thanks for your information..........................
thanks..........................................................

dinq123

谢谢分享！

lizpmemory

谢谢啊

sean202

nice book. Thank you!

gentlegnat

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gentlegnat

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