[高清晰版]VLSI Test Principles and Architectures Design for Testability

dendrite · 发表于 2009-1-14 23:28:44

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VLSI Test Principles and Architectures Design for TestabilityHardcover: 808 pages Publisher: Morgan Kaufmann; 1 edition (July 21, 2006) Language: English ISBN-10: 0123705975 ISBN-13: 978-0123705976
In the era of large systems embedded in a single system-on-chip (SOC) and fabricated continuously shrinking technologies, it is important to ensure correct behavior of the whole system. Electronic design and test engineers of today have to deal with these complex and heterogeneous systems (digital, mixed-signal, memory), but few have the possibility to study the whole field in a detailed and deep way. This book provides an extremely broad knowledge of the discipline, covering the fundamentals in detail, as well as the most recent and advanced concepts.

humann · 发表于 2009-1-15 00:40:05

good book

wafergao · 发表于 2009-1-15 06:25:05

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wafergao · 发表于 2009-1-15 06:29:39

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pedro888 · 发表于 2009-1-15 07:41:31

thanks for your information..........................
thanks..........................................................

dinq123 · 发表于 2009-1-17 09:34:48

谢谢分享！

lizpmemory · 发表于 2009-1-19 21:15:33

谢谢啊

sean202 · 发表于 2009-1-21 14:47:53

nice book. Thank you!

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[高清晰版]VLSI Test Principles and Architectures Design for Testability

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