Content
1 Introduction
2 Design for Testability
3 Logic and Fault Simulation
4 Test Generation
5 Logic Built-In Self-Test
6 Test Compression
7 Logic Diagnosis
8 Memory Testing and Built-In Self-Test
9 Memory Diagnosis and Built-In Self-Repair
10 Boundary Scan and Core-Based Testing
11 Analog and Mixed-Signal Testing
12 Test Technology Trends in the Nanometer Age