|
|
马上注册，结交更多好友，享用更多功能，让你轻松玩转社区。
您需要 登录 才可以下载或查看，没有账号？注册
x
An Introduction to Logic Circuit Testing (Synthesis Lectures on Digital Circuits and Systems)
by Parag K. Lala
[size=120%]An Introduction to Logic Circuit Testing (Synthesis Lectures on Digital Circuits and Systems)
By Parag K. Lala
- Publisher: Morgan and Claypool Publishers
- Number Of Pages: 110
- Publication Date: 2008-11-04
- ISBN-10 / ASIN: 1598293508
- ISBN-13 / EAN: 9781598293500
- Binding: Paperback
Product Description:
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References |
|
/1 
eetop公众号
创芯大讲堂
创芯人才网
发表于 2008-11-25 09:33:38
