Live-insertion capability is an essential part of today’s high-speed data systems because
those systems are expected to run continuously without being powered down. This
application report delves into the cause and prevention of live-insertion and
nanosecond-discontinuity effects, using both simulation and actual test measurements from
a specially built GTLP EVM. Hypothetical cases for precharge circuitry are also simulated for
comparison of the impact of live-insertion events on different logic families. GTLP test results
and simulation of the new VME technology show their robustness in dealing with
live-insertion events.
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发表于 2008-10-31 22:07:19
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