|
马上注册,结交更多好友,享用更多功能,让你轻松玩转社区。
您需要 登录 才可以下载或查看,没有账号?注册
x
This white paper addresses the importance of ESD on Electronic Circuits. The objective
is to present an insight into the present-day phenomena, an overview of its effects on
electronic chips and systems, and a summary of the future issues and challenges facing
ESD reliability as further advances in the semiconductor technologies are made.
With contributions from several leading experts in the different areas of the field, the
state-of-the-art information about ESD is presented here in different chapters. These
include details of controlling the ESD threat from the factory point of view to designing
ESD on the IC chip itself. They also cover the methods to measure and test the ESD
levels, the impact of the advanced IC technologies, simulation of the ESD effects, and
finally the real challenges facing the ESD reliability for the next decade.
It is intended that this white paper will inform the reader about the serious nature of ESD
for the next generation of electronics and subsequently the urgent need to make further
research to maintain safe operation of these devices, whether they may be for
consumer, industrial, military, or medical applications. It is further aimed that research
organizations and government agencies will benefit from the contents of this document
to allow for funding and encouragement of research and development in ESD. |
|