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“Study of triggering inhomogeneities in gg-nMOS ESD protection devices via thermal mapping using backside laser interferometry”
- M. Litzenbergera,
- K. Esmarkb,
- D. Poganya,
- C. Fürböcka,
- H. Gossnerb,
- E. Gornika,
- W. Fichtnerc
- a Institute for Solid State Electronics, Vienna University of Technology, Floragasse 7, A-1040 Wien, Austria
- b Infineon Technologies, D-81617 Munich, Germany
- c ETH Zurich, Integrated Systems Laboratory, Gloriastrasse 35, CH-8092 Zurich, Switzerland
http://www.sciencedirect.com/science/article/pii/S0026271400001414
多谢啊!!! |
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