找一篇 Theses:Device-Circuit Reliability Co-Design in High voltage

Capricorn0115

•   etd@IISc
• Division of Electrical, Electronics, and Computer Science (EECS)
• Electronic Systems Engineering (ESE)
  

Device-Circuit Reliability Co-Design in High voltage and Power devices
由 HB Variar 著作 · 2022
The first part of this work strives to bridge the device-circuit co-design gap that has severely limited predictive modelling of circuits for high power applications such as Radio Frequency Power Amplifiers (RF PAs) using high power devices LDMOSs and GaN HEMTs.