义务为大家提供所以在IEEE 网址上可以下载的paper

jpfu

麻烦楼主~~

purplestar

An Analysis of Latch Comparator Offset Due to Load Capacitor Mismatch
Nikoozadeh, A. Murmann, B. Dept. of Electr. Eng., Stanford Univ., CA; This paper appears in: Circuits and Systems II: Express Briefs, IEEE Transactions on Publication Date: Dec. 2006 Volume: 53, Issue: 12 On page(s): 1398-1402 ISSN: 1549-7747 INSPEC Accession Number: 9261463 Digital Object Identifier: 10.1109/TCSII.2006.883204 Date Published in Issue: 2006-12-19 09:38:45.0

http://ieeexplore.ieee.org/xpls/abs_all.jsp?tp=&arnumber=4033159&isnumber=4033140

谢谢楼主

laundry

楼主  好人啊

semico_ljj

2

riyueguanghua

真的很感谢了

topeeit

感謝阿

wangsun

2011, process, digital
A 1.39-V input fast-transient-response digital LDO composed of low-voltage MOS transistors in 40-nm CMOS process

Solid State Circuits Conference (A-SSCC), 2011 IEEE Asian Date of Conference:14-16 Nov. 2011 Page(s):37 - 40 Print ISBN:978-1-4577-1784-0 INSPEC Accession Number:12459733

谢谢

whu304

回复 67# wangsun


   看到了就顺便下下来了  怎么插入附件。。

尤飞龙

谢谢分享!

hx_x

楼猪真是活雷锋呀，我上次怎么都找不到文献了