集成电路系统测试问题

cb114417

最近看毫米波收发机的论文，经常看到类似这句的话，“The circuits in the array were also characterized using breakouts containing particular blocks (the individual block-level measurements were described in [url=]Section III[/url]). In this section, on-wafer Rx IC measurements are presented."

想问一下using breakouts containing particular blocks是什么意思呢？是在说小模块怎么测试吗？