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by Manjul Bhushan, Mark B. Ketchen
Springer 2015
In CMOS Test and Evaluation: A Physical Perspective, we have attempted to
describe the relationship between basic circuit components (resistors, capacitors
and diodes, and MOSFETs) and a complex CMOS chip with as many as several
billion transistors. Our approach is to provide an overview with examples to
link various aspects of CMOS technology, design, and test. Simulated data representative
of that acquired during electrical testing in product manufacturing and
qualification are used to illustrate concepts and to demonstrate data visualization
and presentation. |
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发表于 2021-9-12 13:25:38
