|
马上注册,结交更多好友,享用更多功能,让你轻松玩转社区。
您需要 登录 才可以下载或查看,没有账号?注册
×
IEEE ELECTRON DEVICE LETTERS, VOL. 28, NO. 1, JANUARY 2007
Bond Pad Design With Low Capacitance in CMOS
Technology for RF Applications
Yuan-Wen Hsiao, Student Member, IEEE, and Ming-Dou Ker, Senior Member, IEE
Abstract—A new bond pad structure in CMOS technology
with low capacitance for gigahertz radio frequency applications
is proposed. Three kinds of inductors stacked under the pad are
used in the proposed bond pad structure. Experimental results
have verified that the bond pad capacitance is reduced due to
the cancellation effect provided by the inductor embedded in
the proposed bond pad structure. The new proposed bond pad
structure is fully process-compatible to general CMOS processes
without any extra process modification.
Index Terms—Bond pad, capacitance, loss, radio frequency
integrated circuit (RF IC). |
|