2007 CICC: 7, 9

casdvo

Session 7 – Emerging Wireless Applications

Fir Ballroom, Monday Afternoon, September 17

Chair :  Stefan Drude

Co-Chair :  Earl McCune

Progress in achieving high levels of integration is presented for single chip solutions in satellite TV, WiMax-WiBRO, GPS, and RFID applications, using a variety of process technologies.

1:30 pm

Introduction

7.1  -  1:35 pm

A Single-Conversion SiGe BiCMOS Satellite TV LNB Front-End Using an Image Reject Mixer and a Calibrated Full-Rate VCO

A. Maxim, M. Gheorghe, D. Smith, Maxim, Inc.

7.2  -  2:00 pm

A Low Power, High Performance BiCMOS MIMO/Diversity Direct Conversion Transceiver IC For WiBro/WiMAX (802.16e) (INVITED PAPER)

M. Locher, M. Tomesen, J. Kuenen, A. Daanen, H. Visser, B. Essink, P.P. Vervoort, M. Nijrolder, R. Kopmeiners, W. Redman-White, R. Balmford, R. El Waffaoui, NXP Semiconductors

7.3  -  2:25 pm

A Low-IF CMOS Simultaneous GPS Receiver Integrated in a Multimode Transceiver

Y. Xu, K. Wang, T. Pals, A. Hadjichristos, K. Sahota and C. Persico, Qualcomm, Inc.

7.4  -  2:50 pm

A Single-Chip UHF RFID Reader in 0.18 µm  CMOS

W. Wang, S. Lou, K. Chui, S. Rong, C.-F. Lok, H. Zheng, H.T. Chan, S.W. Man, H.C. Luong, V.K. Lau and C.-Y. Tsui, Hong Kong University of Science and Technology

Session 9 – Test, Characterization, and Jitter of High-Speed Serial I/O and Clocks

Cedar Ballroom

Monday Afternoon, September 17

Chair:  Jeanne Trinko Mechler

Co-Chair :  Gordon Roberts

Characterization, test and jitter measurements are reaching picosecond resolution for high speed serial links and clock networks.

1:30 pm

Introduction

9.1  -  1:35 pm

Testing SerDes Beyond 4 Gbps – Changing Priorities (INVITED PAPER)

S. Sunter and A. Roy, LogicVision

9.2  -  2:00 pm

Challenges and Solutions for Standards-Based Serial 10 Gb/s Backplane Ethernet (INVITED PAPER)

A. Healey, LSI Corporation

9.3  -  2:50 pm

2GS/s, 10ps Resolution CMOS Differential Time-to-Digital Converter for Real-Time Testing of Source-Synchronous Memory Device

K. Yamamoto, M. Suda and T. Okayasu, Advantest Corporation

3:15 pm - BREAK

9.4  -  3:35 pm

Optimizing Circuit Performance and ESD Protection for High-Speed Differential I/Os

H. Sarbishaei, O. Semenov and M. Sachdev, University of Waterloo

9.5  -  4:00 pm

Embedded Test Features for High-Speed Serial I/O (INVITED PAPER)

J. Rearick, Advanced Micro Devices

9.6  -  4:25 pm

On-Chip Circuit for Measuring Period Jitter and Skew of Clock Distribution Networks

K. Jenkins, IBM TJ Watson Research Center, K. Shepard and Z. Xu, Columbia University

9.7  -  4:50 pm

Mismatch-Tolerant Circuit for On-Chip Measurements of Data Jitter

K. Ichiyama, M. Ishida, T. Yamaguchi, Advantest Laboratories, and M. Soma, University of Washington

northfish

thanks a lot, man.

liuzhieetop

alfread

多谢分享

erictien

好东西啊!!!

pickpunk

谢谢分享！！

amplifier

多谢楼组

edwardk

学习中。。。。