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本帖最后由 龚_利90 于 2014-9-3 21:15 编辑
Advanced Field-Solver Techniques for RC Extraction of Integrated CircuitsSpringer Berlin Heidelberg (2014)
Resistance and capacitance (RC) extraction is an essential step in modeling the interconnection wires and substrate coupling effect in nanometer-technology integrated circuits (IC). The field-solver techniques for RC extraction guarantee the accuracy of modeling, and are becoming increasingly important in meeting the demand for accurate modeling and simulation of VLSI designs. Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits presents a systematic introduction to, and treatment of, the key field-solver methods for RC extraction of VLSI interconnects and substrate coupling in mixed-signal ICs. Various field-solver techniques are explained in detail, with real-world examples to illustrate the advantages and disadvantages of each algorithm.
Content:
Front Matter....Pages i-xv
Introduction....Pages 1-6
Basic Field-Solver Techniques for RC Extraction....Pages 7-18
Fast Boundary Element Methods for Capacitance Extraction (I)....Pages 19-37
Fast Boundary Element Methods for Capacitance Extraction (II)....Pages 39-70
Resistance Extraction of Complex 3-D Interconnects....Pages 71-89
Substrate Resistance Extraction with Boundary Element Method....Pages 91-106
Extracting Frequency-Dependent Substrate Parasitics....Pages 107-119
Process Variation-Aware Capacitance Extraction....Pages 121-152
Statistical Capacitance Extraction Based on Continuous-Surface Geometric Model....Pages 153-178
Fast Floating Random Walk Method for Capacitance Extraction....Pages 179-208
FRW-Based Solver for Chip-Scale Large Structures....Pages 209-231
Back Matter....Pages 233-246[url=]Advanced Field-Solver Techniqu ...[/url]
Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits.rar
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