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"Electrical Overstress Power Profiles: A Guideline to Qualify EOS Hardness of Semiconductor Devices"
- Carlos Díaza,
- Sung-Mo Kanga
- a University of Illinois at Urbana-Champaign, Coordinated Science Laboratory, 1308 West Main Street, Urbana, IL 61801, USA
- Charvaka Duvvuryb,
- Larry Wagnerb
- b Texas Instruments Incorporated, M/S 461, P.O. Box 655012, Dallas, TX 75265, USA
- Received 13 October 1992. Accepted 6 April 1993. Available online 12 February 2003
http://www.sciencedirect.com/science/article/pii/030438869390007T
多谢各位了!! |
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