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Design for ESD reliability in high-frequency mixed-signal integrated circuits
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您需要 登录 才可以下载或查看,没有账号?注册  By JAESIK LEE   University of Illinios at Urbana-CHampaign, 2001
 
 
 Electrostatic discharge protection for gallium arsenide devices and integrated circuits
 By MAOYOU SUN   The University of New Jersey 2005
 
 Investigation of ESD performance in advanced CMOS technology
 By Kwang-Hoon Oh  Stanford university 2002
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