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Design for ESD reliability in high-frequency mixed-signal integrated circuits
By JAESIK LEE University of Illinios at Urbana-CHampaign, 2001
Electrostatic discharge protection for gallium arsenide devices and integrated circuits
By MAOYOU SUN The University of New Jersey 2005
Investigation of ESD performance in advanced CMOS technology
By Kwang-Hoon Oh Stanford university 2002 |
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