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Soft Errors in Modern Electronic Systems (Frontiers in Electronic Testing)
By Michael Nicolaidis
Publisher: Springer
Number Of Pages: 368
Publication Date: 2010-09-30
ISBN-10 / ASIN: 1441969926
ISBN-13 / EAN: 9781441969927
Product Description:
This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques.
The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.
TOC:
1 Soft Errors from Space to Ground: Historical Overview,
Empirical Evidence, and Future Trends . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Tino Heijmen
2 Single Event Effects: Mechanisms and Classification . . . . . . . . . . . . . . . . . . 27
Re´mi Gaillard
3 JEDEC Standards on Measurement and Reporting of Alpha
Particle and Terrestrial Cosmic Ray Induced Soft Errors . . . . . . . . . . . . 55
Charles Slayman
4 Gate Level Modeling and Simulation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
Nadine Buard and Lorena Anghel
5 Circuit and System Level Single-Event Effects Modeling
and Simulation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 103
Dan Alexandrescu
6 Hardware Fault Injection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 141
Luis Entrena, Celia Lo´pez Ongil, Mario Garcı´a Valderas,
Marta Portela Garcı´a, and Michael Nicolaidis
7 Integrated Circuit Qualification for Space and Ground-Level
Applications: Accelerated Tests and Error-Rate Predictions . . . . . . . . 167
Raoul Velazco, Gilles Foucard, and Paul Peronnard
8 Circuit-Level Soft-Error Mitigation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 203
Michael Nicolaidis
9 Software-Level Soft-Error Mitigation Techniques . . . . . . . . . . . . . . . . . . . 253
Maurizio Rebaudengo, Matteo Sonza Reorda, and Massimo Violante
10 Specification and Verification of Soft Error Performance
in Reliable Electronic Systems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 287
Allan L. Silburt, Adrian Evans, Ana Burghelea, Shi-Jie Wen,
David Ward, Ron Norrish, Dean Hogle, and Ian Perriman
Index . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 313 |
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发表于 2010-10-12 14:34:10
发表于 2010-10-12 21:23:05
