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发表于 2008-7-21 12:10:54
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Design and layout of a high ESD performance NPN structure forsubmicron BiCMOS/bipolar circuits
Chen, J.Z.; Xin Yi Zhang; Amerasekera, A.; Vrotsos, T.
Reliability Physics Symposium, 1996. 34th Annual Proceedings., IEEE International
Volume , Issue , 30 Apr-2 May 1996 Page(s):227 - 232
Digital Object Identifier 10.1109/RELPHY.1996.492124
Summary:This paper presents a high ESD performance NPN protection structure for advanced submicron BiCMOS and Bipolar processes. Using a Zener trigger circuit and a specific multi-emitter layout technique, this paper successfully demonstrates an optimal protection structure to meet the requirements imposed on advanced submicron circuit applications. The protection circuit has a low trigger voltage as well as a low capacitance load and does not add any series resistance |
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